Title :
A production performance database and query software for integrated circuit manufacturing
Author :
Farrell, Brian L.
Author_Institution :
AT&T Bell Lab., Holmdel, NJ, USA
Abstract :
The author describes a production performance database that allows engineers and shop managers of integrated-circuit factories to monitor the performance of their facilities. The database combines actual processing data from the production systems with estimates of processing times to give a measure of how efficiently the facilities are being used. In addition, the database contains other performance measures such as queuing delays and production time variances. The users access the data through two menu-driven programs. One program uses window-based software to display the clean room areas, facilities, and facility groups for which data are available. The user needs only to type a single-word command to run the software and is prompted for all inputs through menus. The other program is an interactive report generator that allows the user to customize a report to suit his or her needs. The program leads the user through a series of questions to determine which area, time interval, performance measures, and report formats he or she would like to use. Engineers and shop managers have used both programs to track the performance of particular facilities and facility groups and to identify problem areas
Keywords :
computerised monitoring; database management systems; integrated circuit manufacture; user interfaces; actual processing data; engineers access to database; estimates of processing times; identify problem areas; integrated circuit manufacturing; integrated-circuit factories; interactive report generator; menu-driven programs; performance measures; production performance database; production time variances; prompted for all inputs through menus; query software; queuing delays; series of questions; shop managers access to database; single-word command; window-based software; Data engineering; Databases; Delay effects; Displays; Engineering management; Monitoring; Production facilities; Production systems; Software performance; Time measurement;
Conference_Titel :
Semiconductor Manufacturing Science Symposium, 1990. ISMSS 1990., IEEE/SEMI International
Conference_Location :
Burlingame, CA
DOI :
10.1109/ISMSS.1990.66126