Title :
Variable end-of-travel Sensor
Author_Institution :
Universal Instruments Corporation, Binghamton, New York
Keywords :
Costs; Delay effects; Economic forecasting; Integrated circuit reliability; Magnetic heads; Magnetic sensors; Sensor phenomena and characterization; Switches; Throughput; Transducers;
Conference_Titel :
Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
DOI :
10.1109/STIER.1987.716362
