DocumentCode :
3234840
Title :
Measurement And Analysis Of Propogation characteristics In Silicon clad dielectric waveguides
Author :
Hcwell, B.P. ; McWright, G.M. ; Batchman, T.E.
Author_Institution :
University Of Virginia
fYear :
1981
fDate :
5-8 April 1981
Firstpage :
743
Lastpage :
747
Keywords :
Dielectric measurements; Optical attenuators; Optical modulation; Optical propagation; Optical waveguides; Permittivity; Semiconductor waveguides; Silicon; Substrates; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Southeastcon '81. Conference Proceedings
Conference_Location :
Huntsville, AL, USA
Type :
conf
DOI :
10.1109/SECON.1981.673571
Filename :
673571
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3234840
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