Title :
A miniature magnetic field probe for measuring fields in planar high-frequency circuits
Author :
Yingjie Gao ; Wolff, I.
Author_Institution :
Dept. of Electr. Eng., Gerhard Mercator Univ., Duisburg, Germany
Abstract :
A new non-contacting miniature magnetic field probe for measuring the surface current distribution on high-frequency planar circuits in the 5-20 GHz band has been designed, fabricated and tested. This field probe has a very small dimension and needs no connection to the operating circuit under test, therefore there is almost no perturbation on the circuit properties. This simple and practical magnetic field probe can be used to assist the design of microwave circuits and to test products in industry.<>
Keywords :
current distribution; integrated circuit testing; magnetic field measurement; magnetic sensors; microstrip circuits; microwave integrated circuits; microwave measurement; probes; 5 to 20 GHz; MIC; miniature magnetic field probe; noncontacting probe; planar high-frequency circuits; surface current distribution; Circuit synthesis; Circuit testing; Conductors; Current measurement; Electric variables measurement; Magnetic circuits; Magnetic field measurement; Microwave devices; Microwave integrated circuits; Probes;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406177
