• DocumentCode
    3234898
  • Title

    Using historic test program data to improve the repair process

  • Author

    Craig, Richard W.

  • Author_Institution
    Boeing Co., St. Louis, MO
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    159
  • Lastpage
    163
  • Abstract
    Data collected during an automatic test program execution can provide much insight into the operation of the unit being tested that was not available when the original test program was developed. When a test program is being formulated, the developer generally does not have any data on the precise failure modes of the unit. Typically, the predicted reliability analysis data along with the generally accepted failure mode assumptions are used to develop the requirements for testing the unit. If the assumptions made during the test requirements document (TRD) development turn out to be inaccurate, the test program will be suboptimal. This could result in a longer mean time to repair (MTTR) as well as a greater demand on the spare parts supply line and thereby result in a higher cost for repair. Efficient estimators of the repair process statistics must be derived from the test data. Test programs executed on automatic test equipment have test results available at execution time that can easily be saved to form a historical data warehouse. The analysis of this data will reveal how well the test program is performing as well as how the program can be improved. Improvements can result from more accurate diagnostic callouts or less time taken to obtain the correct callout. This paper will demonstrate a methodology that uses historic test program data to validate the TRD assumptions and improve the repair process where the original TRD assumptions are shown to be invalid.
  • Keywords
    automatic test equipment; electronic equipment testing; maintenance engineering; statistical analysis; automatic test equipment; automatic test program execution; failure mode data; historic test program data; reliability analysis data; repair process statistics; statistical analysis; test requirements document; Aerospace electronics; Automatic testing; Cities and towns; Costs; Data analysis; Electronic equipment testing; Fault detection; Performance evaluation; Statistical analysis; System testing; historical date; statistical analysis; test program statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662604
  • Filename
    4662604