Title :
Test point selection of analog circuits based on fuzzy theory and ant colony algorithm
Author :
Zhang Chao-jie ; He Guo ; Liang Shu-hai
Author_Institution :
Coll. of Naval Archit. & Power, Naval Univ. of Eng., Wuhan
Abstract :
Optimum selection of test points can reduce the test cost by eliminating redundant measurements and is important to reduce the computation cost. In order to select the optimum test points of analog circuits, a method based on fuzzy theory and ant colony algorithm is proposed. The traditional ant colony algorithm model was updated for test point selection of analog circuits. The basic model is given and the general rule to use this method to select the optimum test points of analog circuits is described in detail. The proposed method was used in the fault diagnosis system of time delay circuit board used in the remote-control system of some marine engine. The results show that this method can educe the optimum test points and has high practical value.
Keywords :
analogue circuits; fault diagnosis; fuzzy set theory; integrated circuit testing; analog circuits; ant colony algorithm; fault diagnosis; fuzzy theory; marine engine; remote-control system; test point selection; time delay circuit board; Analog circuits; Circuit faults; Circuit testing; Cost function; Delay effects; Engines; Fault diagnosis; Optimization methods; Printed circuits; System testing; analog circuits; ant colony algorithm (ACA); fault diagnosis; fuzzy theory; test point selection;
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2008.4662605
