Dramatically reduce TPS development costs over all ATE platforms while still achieving accurate test results

Functional test for Weapons Replaceable Assemblies (WRA) or Line Replaceable Units (LRU) has advanced in an attempt to keep up with technological strides made in todaypsilas various military systems. However, with more functions being installed on Circuit Card Assemblies (CCA) more failure options become present and the actual test system is taxed to do more work. Test Program Set (TPS) software development methods have not changed dramatically from previous years due to the nature of what they are attempting. Thus, what was once a laborious process at best has now become a multi-million dollar, multi-year task developed on a system that is not designed to achieve the actual goal, finding faults on the CCA. This paper will present an alternative to current TPS procedures that will be less expensive and more efficient.