Title :
The study of nonlinear scattering functions and X-parameters
Author :
Sun, Guoquan ; Xu, Yanfeng ; Liang, Anhui
Author_Institution :
Nat. Key Lab. of Sci. & Technol. on Electron. Test & Meas., Qingdao, China
Abstract :
This paper focuses on the study of nonlinear scattering functions and X-parameters. The relation of scattering functions and X-parameters, which are established on the Polyharmonic Distortion modeling (PHD), is researched first. And then we propose that X-parameters are the first order linear approximation of nonlinear scattering functions. The data for nonlinear scattering functions and X-parameters are extracted successfully by the time-domain extraction system and by the nonlinear vector networks analyzer (NVNA), respectively. Nonlinear scattering functions and X-parameters both accurately describe the behavior of nonlinear microwave device, and they play an important role in the measurement and design of nonlinear microwave circuits.
Keywords :
S-parameters; microwave circuits; network analysers; nonlinear network analysis; time-domain analysis; X-parameters; first order linear approximation; nonlinear microwave circuit design measurement; nonlinear microwave device behavior; nonlinear scattering functions; nonlinear vector networks analyzer; polyharmonic distortion modeling; time-domain extraction system; Data mining; Distortion measurement; Electronic equipment testing; Frequency; Laboratories; Microwave devices; Paper technology; Power system modeling; Scattering parameters; Sun;
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
DOI :
10.1109/ICMMT.2010.5525111
