Title :
The MAP Pilot Project at IBM Endicott
Author_Institution :
IBM Endicott
Keywords :
Application software; Circuits; Manufacturing automation; Manufacturing industries; Manufacturing processes; Monitoring; Programmable control; Programmable logic arrays; Protocols; Strontium;
Conference_Titel :
Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
DOI :
10.1109/STIER.1987.716372