DocumentCode
3235091
Title
Simplifying the economics of test and repair in both the factory and depot
Author
Lowenstein, Duane
Author_Institution
Agilent Technol., Andover, MA
fYear
2008
fDate
8-11 Sept. 2008
Firstpage
222
Lastpage
226
Abstract
When it comes to understanding the Cost of Test, we all tend to start philosophizing on the multitude of factors that must go into such an equation. In fact, the Office of the Secretary of Defense, Cost Analysis Improvement Group took over 149 pages to layout all the attributes and assumptions in 1992. This paper explores a different way of approaching the problem. Instead of developing algorithms and defining attributes bottoms- up for every and all factors of a test strategy, this approach looks at a top down methodology. Taking a systems view of the process, and associated costs of test, a minimum set of data and related cost are all that are needed to get a 90% understanding of the cost of test. More importantly, these models can show gaps in strategies and leverage areas for eliminating test and process steps and thus associated costs.
Keywords
cost-benefit analysis; costing; product life cycle management; cost of test; test and repair; Assembly; Cellular phones; Circuit testing; Cities and towns; Cost function; Manufacturing; Materials testing; Production facilities; Radio frequency; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2008 IEEE
Conference_Location
Salt Lake Cirty, UT
ISSN
1088-7725
Print_ISBN
978-1-4244-2225-8
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2008.4662615
Filename
4662615
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