• DocumentCode
    3235091
  • Title

    Simplifying the economics of test and repair in both the factory and depot

  • Author

    Lowenstein, Duane

  • Author_Institution
    Agilent Technol., Andover, MA
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    222
  • Lastpage
    226
  • Abstract
    When it comes to understanding the Cost of Test, we all tend to start philosophizing on the multitude of factors that must go into such an equation. In fact, the Office of the Secretary of Defense, Cost Analysis Improvement Group took over 149 pages to layout all the attributes and assumptions in 1992. This paper explores a different way of approaching the problem. Instead of developing algorithms and defining attributes bottoms- up for every and all factors of a test strategy, this approach looks at a top down methodology. Taking a systems view of the process, and associated costs of test, a minimum set of data and related cost are all that are needed to get a 90% understanding of the cost of test. More importantly, these models can show gaps in strategies and leverage areas for eliminating test and process steps and thus associated costs.
  • Keywords
    cost-benefit analysis; costing; product life cycle management; cost of test; test and repair; Assembly; Cellular phones; Circuit testing; Cities and towns; Cost function; Manufacturing; Materials testing; Production facilities; Radio frequency; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662615
  • Filename
    4662615