DocumentCode :
3235173
Title :
Making custom measurements with high-speed digitizers - In the FPGA or host processor
Author :
Hottenroth, John ; Webb, Patrick
Author_Institution :
Nat. Instrum., Austin, TX
fYear :
2008
fDate :
8-11 Sept. 2008
Firstpage :
249
Lastpage :
251
Abstract :
Test instrumentation, including digitizers (also known as PC-based oscilloscopes), has continued to offer higher sampling speeds and better resolution to keep up with the ever-increasing demands of devices under test. Test instrumentation usability has also improved by allowing the end user, instead of the vendor, to define instrument functionality and create programs to run on the PC and even the digitizer, which better harness the hardware capabilities of the instrument. This effectively allows a digitizer to be used as an oscilloscope, a spectrum analyzer, or even a custom instrument in a niche application. No matter what the application, one thing is in common: the need for increasing amounts of test data continues to be an issue. This paper discusses how to overcome the challenges of managing and processing the large amounts of data acquired by a high-speed digitizer.
Keywords :
analogue-digital conversion; automatic test equipment; field programmable gate arrays; microprocessor chips; oscilloscopes; spectral analysers; Custom Measurements; FPGA; PC-based oscilloscopes; devices under test; high-speed digitizers; host processor; spectrum analyzer; test instrumentation; Application software; Data processing; Field programmable gate arrays; Hardware; Instruments; Multicore processing; Oscilloscopes; Performance evaluation; Software testing; Time measurement; FPGA; PXI Express; digitizer; in-line data; processing; stream data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
ISSN :
1088-7725
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2008.4662620
Filename :
4662620
Link To Document :
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