• DocumentCode
    3235173
  • Title

    Making custom measurements with high-speed digitizers - In the FPGA or host processor

  • Author

    Hottenroth, John ; Webb, Patrick

  • Author_Institution
    Nat. Instrum., Austin, TX
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    249
  • Lastpage
    251
  • Abstract
    Test instrumentation, including digitizers (also known as PC-based oscilloscopes), has continued to offer higher sampling speeds and better resolution to keep up with the ever-increasing demands of devices under test. Test instrumentation usability has also improved by allowing the end user, instead of the vendor, to define instrument functionality and create programs to run on the PC and even the digitizer, which better harness the hardware capabilities of the instrument. This effectively allows a digitizer to be used as an oscilloscope, a spectrum analyzer, or even a custom instrument in a niche application. No matter what the application, one thing is in common: the need for increasing amounts of test data continues to be an issue. This paper discusses how to overcome the challenges of managing and processing the large amounts of data acquired by a high-speed digitizer.
  • Keywords
    analogue-digital conversion; automatic test equipment; field programmable gate arrays; microprocessor chips; oscilloscopes; spectral analysers; Custom Measurements; FPGA; PC-based oscilloscopes; devices under test; high-speed digitizers; host processor; spectrum analyzer; test instrumentation; Application software; Data processing; Field programmable gate arrays; Hardware; Instruments; Multicore processing; Oscilloscopes; Performance evaluation; Software testing; Time measurement; FPGA; PXI Express; digitizer; in-line data; processing; stream data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662620
  • Filename
    4662620