DocumentCode :
3235209
Title :
A novel methodology to combine and speed-up the verification process of simulation and measurement of integrated circuits
Author :
Pirker-Frühauf, Anton ; Kunze, Matthias
Author_Institution :
KAI Kompetenzzentrum Automobil, Ind.-Elektron. GmbH, Villach
fYear :
2008
fDate :
8-11 Sept. 2008
Firstpage :
259
Lastpage :
262
Abstract :
A typical IC verification process involves several stages from design, to measurement and testing. Many simulation and measurement tools are used for this process. As complexity of ICs increases, effort for verification increases and even further boosts NRE cost. In order to address this issue, we propose a new verification process resulting in a single EXecutable Verification Plan (XVP).
Keywords :
automatic test software; circuit simulation; integrated circuit measurement; executable verification plan; integrated circuit complexity; integrated circuit measurement; integrated circuit simulation; integrated circuit verification process; Automatic testing; Circuit simulation; Current measurement; Debugging; Electrical resistance measurement; Integrated circuit measurements; Pulse measurements; Sea measurements; Time measurement; Velocity measurement; ATML; IC Verification; Verification plan; XML; XSLT;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
ISSN :
1088-7725
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2008.4662622
Filename :
4662622
Link To Document :
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