DocumentCode
3235209
Title
A novel methodology to combine and speed-up the verification process of simulation and measurement of integrated circuits
Author
Pirker-Frühauf, Anton ; Kunze, Matthias
Author_Institution
KAI Kompetenzzentrum Automobil, Ind.-Elektron. GmbH, Villach
fYear
2008
fDate
8-11 Sept. 2008
Firstpage
259
Lastpage
262
Abstract
A typical IC verification process involves several stages from design, to measurement and testing. Many simulation and measurement tools are used for this process. As complexity of ICs increases, effort for verification increases and even further boosts NRE cost. In order to address this issue, we propose a new verification process resulting in a single EXecutable Verification Plan (XVP).
Keywords
automatic test software; circuit simulation; integrated circuit measurement; executable verification plan; integrated circuit complexity; integrated circuit measurement; integrated circuit simulation; integrated circuit verification process; Automatic testing; Circuit simulation; Current measurement; Debugging; Electrical resistance measurement; Integrated circuit measurements; Pulse measurements; Sea measurements; Time measurement; Velocity measurement; ATML; IC Verification; Verification plan; XML; XSLT;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2008 IEEE
Conference_Location
Salt Lake Cirty, UT
ISSN
1088-7725
Print_ISBN
978-1-4244-2225-8
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2008.4662622
Filename
4662622
Link To Document