DocumentCode :
3235317
Title :
Nonlinear lumped electrical model for contour mode AlN resonators
Author :
Segovia-Fernandez, Jeronimo ; Tazzoli, Augusto ; Rinaldi, Matteo ; Piazza, Gianluca
Author_Institution :
Dept. of Electr. & Syst. Eng., Univ. of Pennsylvania, Philadelphia, PA, USA
fYear :
2011
fDate :
18-21 Oct. 2011
Firstpage :
1846
Lastpage :
1849
Abstract :
This paper presents a lumped electrical model to simulate the nonlinear behavior of aluminum nitride contour mode resonators. The model is derived from the Duffing equation and validated through experiments. Amplitude-frequency (A-f) and third order intermodulation distortion (IMD3) measurements were performed to extract an equivalent nonlinear coefficient α. The two experiments yield the same results when the system is dominated by thermally-induced nonlinearities. In case of high frequency modulations, purely mechanical non-linearity can also be extracted.
Keywords :
intermodulation; resonators; Duffing equation; aluminum nitride contour mode resonator; amplitude frequency; contour mode AlN resonator; equivalent nonlinear coefficient; high frequency modulation; nonlinear behavior; nonlinear lumped electrical model; thermally induced nonlinearity; third order intermodulation distortion measurement; Acoustics; Electrodes; Frequency measurement; Integrated circuit modeling; Mathematical model; Resonant frequency; Temperature measurement; AlN contour mode resonator; Duffing equation; amplitude-frequency; intermodulation distortion; lumped electrical model; nonlinearities; thermal effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium (IUS), 2011 IEEE International
Conference_Location :
Orlando, FL
ISSN :
1948-5719
Print_ISBN :
978-1-4577-1253-1
Type :
conf
DOI :
10.1109/ULTSYM.2011.0461
Filename :
6293681
Link To Document :
بازگشت