An XML-based test development and deployment framework for mixed-signal and digital devices

A framework is proposed to shorten the test development and deployment times and to ensure test data integrity throughout the life-cycle of an IC. The approach targets both digital and mixed-signal devices by employing a number of existing tools and technologies, while also enabling cross-academia and -industry research and development on described test-process-related issues, by enabling an actual distributed technical setting. As an add-on, yield analysis capabilities emerge from the technical setting.