Title :
Finite element analysis of microstrip line on ferroelectric (Ba-Sr)TiO/sub 3/ substrate
Author :
Young Chul Sung ; Sanghoon Choi ; Sangwook Nam
Author_Institution :
Dept. of Electron. Eng., Seoul Nat. Univ., South Korea
Abstract :
The characteristics of microstrip line on ferroelectric (Ba-Sr)TiO/sub 3/ substrate is analyzed. The static field analysis is performed iteratively to obtain the position-dependent dielectric constant in BST substrate with DC bias voltage. On the assumption of small AC field compared to DC field, the propagation constant and the characteristic impedance of the microstrip line on such a biased BST substrate is found by edge-based finite element method. The results can be used for the accurate design of various devices using BST such as dielectric phase shifter, voltage controlled resonators, etc.<>
Keywords :
ferroelectric devices; finite element analysis; microstrip lines; permittivity; substrates; transmission line theory; BaSrTiO/sub 3/; biased BST substrate; characteristic impedance; edge-based FEM; ferroelectric substrate; finite element method; microstrip line; position-dependent dielectric constant; propagation constant; static field analysis; Binary search trees; Dielectric constant; Dielectric substrates; Ferroelectric materials; Finite element methods; Impedance; Microstrip; Performance analysis; Propagation constant; Voltage;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406200
