• DocumentCode
    3235437
  • Title

    Non-perturbative fullwave analysis of lossy planar circuits

  • Author

    Amari, Smain ; Bornemann, Jens

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
  • fYear
    1995
  • fDate
    16-20 May 1995
  • Firstpage
    1277
  • Abstract
    A non-perturbative analysis, including both metallic and dielectric losses, of planar circuits is presented. The Green´s impedance dyadics are modified to account for metallic losses in the ground plane and the conducting surfaces. Dielectric constants are allowed complex values to describe their lossy properties. The complex resistive boundary condition is modified to take into account the fact that thin conductors distinguish between LSE and LSM modes. The theory describes lossy ground planes exactly and is exact for conductors of finite width in the limit of small thickness. Expression for the conductance, the resistance, the inductance and the capacitance matrices are presented as well as corresponding numerical results. Modal attenuation constants and dispersion curves are discussed.<>
  • Keywords
    Green´s function methods; dielectric losses; dispersion (wave); electromagnetic wave propagation; microwave circuits; permittivity; spectral-domain analysis; Green´s impedance dyadics; LSE modes; LSM modes; capacitance matrices; complex resistive boundary condition; conductance; conducting surfaces; dielectric constants; dielectric losses; dispersion curves; finite width conductors; ground plane; inductance matrices; lossy ground planes; lossy planar circuits; metallic losses; modal attenuation constants; nonperturbative fullwave analysis; resistance; Attenuation; Boundary conditions; Capacitance; Circuit analysis; Conductors; Dielectric constant; Dielectric losses; Inductance; Surface impedance; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1995., IEEE MTT-S International
  • Conference_Location
    Orlando, FL, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-2581-8
  • Type

    conf

  • DOI
    10.1109/MWSYM.1995.406204
  • Filename
    406204