DocumentCode :
3235440
Title :
New methodologies for eliminating No Trouble Found, No Fault Found and other non repeatable failures in depot settings
Author :
Santoro, Matt
Author_Institution :
Agilent Technol., Richardson, TX
fYear :
2008
fDate :
8-11 Sept. 2008
Firstpage :
336
Lastpage :
340
Abstract :
New methodologies for eliminating No Trouble Found (NTF), No Fault Found (NFF) and other non repeatable failures in depot (or other) repair settings. Trying to find NTFs or NFFs has been as elusive as catching a leprechaun (and with the price of gold these days, who wouldn´t want to catch a leprechaun and capture his pot of gold!). In fact, in some instances getting to the root cause has become the largest area of investment for a test strategy. In this paper we explore the fundamentals of NTFs and NFFs and show developments in several areas that will allow depots to dramatically reduce these types of errors (results) with innovative solutions.
Keywords :
failure analysis; fault diagnosis; maintenance engineering; depot settings; no fault found; no trouble found; nonrepeatable failures; repair settings; Circuit testing; Cities and towns; Costs; Dairy products; Design engineering; Gold; Investments; Product design; Pulp manufacturing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
ISSN :
1088-7725
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2008.4662636
Filename :
4662636
Link To Document :
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