DocumentCode
3235496
Title
Advances in ULTRA-accurate temperature measurement design
Author
Gareau, James
Author_Institution
Data Translation, Inc, Marlboro, MA
fYear
2008
fDate
8-11 Sept. 2008
Firstpage
348
Lastpage
353
Abstract
Temperature is the worldpsilas most widely measured property. Most temperature measurement instruments deployed today rely on technology architectures developed when silicon-based devices were far more costly and DOS ran computers. New approaches to analog design have changed this paradigm. This paper describes how the latest techniques in analog technology can be applied to the development of ultra-accurate temperature measurement instruments.
Keywords
data acquisition; temperature measurement; analog technology; silicon based devices; ultra-accurate temperature measurement instruments; Crosstalk; DC-DC power converters; Galvanizing; Instruments; Isolation technology; Moore´s Law; Multiplexing; Silicon; Temperature measurement; Voltage; DC/DC converters; Ethernet; LXI; Temperature measurement; USB; data acquisition; galvanic isolation; multiplexers; parallel instruments;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2008 IEEE
Conference_Location
Salt Lake Cirty, UT
ISSN
1088-7725
Print_ISBN
978-1-4244-2225-8
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2008.4662639
Filename
4662639
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