DocumentCode :
3235496
Title :
Advances in ULTRA-accurate temperature measurement design
Author :
Gareau, James
Author_Institution :
Data Translation, Inc, Marlboro, MA
fYear :
2008
fDate :
8-11 Sept. 2008
Firstpage :
348
Lastpage :
353
Abstract :
Temperature is the worldpsilas most widely measured property. Most temperature measurement instruments deployed today rely on technology architectures developed when silicon-based devices were far more costly and DOS ran computers. New approaches to analog design have changed this paradigm. This paper describes how the latest techniques in analog technology can be applied to the development of ultra-accurate temperature measurement instruments.
Keywords :
data acquisition; temperature measurement; analog technology; silicon based devices; ultra-accurate temperature measurement instruments; Crosstalk; DC-DC power converters; Galvanizing; Instruments; Isolation technology; Moore´s Law; Multiplexing; Silicon; Temperature measurement; Voltage; DC/DC converters; Ethernet; LXI; Temperature measurement; USB; data acquisition; galvanic isolation; multiplexers; parallel instruments;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
ISSN :
1088-7725
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2008.4662639
Filename :
4662639
Link To Document :
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