• DocumentCode
    3235553
  • Title

    High power RF testing of dielectric loaded accelerating structures

  • Author

    Gai, Weixin ; Power, J.G. ; Konecny, R. ; Jing, C. ; Liu, Wenxin ; Yusof, Zulkefli Muhammed ; Gold, Steven H. ; Kinkead, A.K.

  • Author_Institution
    High Energy Phys. Div., Argonne Nat. Lab., IL
  • fYear
    2004
  • fDate
    23-26 May 2004
  • Firstpage
    50
  • Lastpage
    53
  • Abstract
    A joint Argonne National Laboratory/Naval Research Laboratory program is under way to investigate X-band dielectric-loaded accelerating (DLA) structures, using high-power 11.424-GHz radiation from the NRL Magnicon Facility. DLA structures offer the potential of a simple, inexpensive alternative to copper disk-loaded structures for use in high-gradient RF linear accelerators. The purpose of the high-power tests is to find the RF breakdown limits of these structures and to test their ability to produce high accelerating gradients. We have recently tested two different dielectric tubes, one with alumina and another with MgCaTi liners. For alumina, we have shown no evidence of RF breakdown at up to 5 MW drive power (equivalent to 8 MV/m accelerating gradient). However, multipactor effect was found to absorb an increasing fraction of the incident microwave power, as the power level was increased, ultimately absorbing half of the incident power. Detailed experimental results and solutions for curing the multipactor will be discussed. We will also report on the most recent test results of MgCaTi dielectric tubes
  • Keywords
    alumina; calcium compounds; dielectric devices; dielectric-loaded waveguides; high-frequency discharges; linear accelerators; magnesium compounds; waveguide couplers; 11.424 GHz; Argonne National Laboratory; MgCaTi; NRL Magnicon Facility; Naval Research Laboratory; RF breakdown; X-band dielectric loaded accelerating structures; alumina; dielectric tubes; high accelerating gradients; high power RF testing; high-gradient RF linear accelerators; Acceleration; Copper; Dielectric devices; Dielectric materials; Electric breakdown; Life estimation; Monitoring; Radio frequency; Testing; Waveguide components;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator Symposium, 2004 and 2004 High-Voltage Workshop. Conference Record of the Twenty-Sixth International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8586-1
  • Type

    conf

  • DOI
    10.1109/MODSYM.2004.1433504
  • Filename
    1433504