• DocumentCode
    3235637
  • Title

    An Extended SVD-based Terminal and Model Order Reduction Algorithm

  • Author

    Liu, Pu ; Tan, Sheldon X D ; Yan, Boyuan ; McGaughy, Bruce

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Riverside, CA
  • fYear
    2006
  • fDate
    14-15 Sept. 2006
  • Firstpage
    44
  • Lastpage
    49
  • Abstract
    The paper proposes a new combined terminal and model order reduction method for compact modeling of interconnect circuits. The new method extends the existing SVDMOR method by using higher order moment information for terminal responses during the terminal reduction and by applying separate SVD low-rank approximations on input and output terminals respectively. This is in contrast to SVDMOR method where input and output terminal responses are SVD approximated at the same time, which can lead to large error when the numbers of inputs and outputs are quite different. We analyze the passivity requirement for combined terminal and model order reduction and show the passivity enforcement may significantly hamper the terminal reduction effects. We also improve the computation efficiency of SVDMOR. Our experimental results show that ESVDMOR outperforms the SVDMOR in terms of accuracy for the similar reduced model sizes in a number of interconnect circuits when the input and output terminals are different
  • Keywords
    RLC circuits; circuit CAD; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; reduced order systems; singular value decomposition; SVD low-rank approximation; SVD-based terminal model order reduction algorithm; interconnect circuit compact modeling; terminal response; Clocks; Complexity theory; Degradation; Integrated circuit interconnections; RLC circuits; Reduced order systems; Timing; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Behavioral Modeling and Simulation Workshop, Proceedings of the 2006 IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-9742-8
  • Type

    conf

  • DOI
    10.1109/BMAS.2006.283468
  • Filename
    4062050