DocumentCode :
3235707
Title :
Improving System Testability and Testing with Microarchitectures
Author :
SabanÉ, Aminata
Author_Institution :
Ptidej Lab., Ecole Polytech. de Montreal, Montréal, QC, Canada
fYear :
2010
fDate :
13-16 Oct. 2010
Firstpage :
309
Lastpage :
312
Abstract :
Testing is essential to ensure software reliability and dependability. however, testing activities are very expensive and complex. Micro architectures, such as design patterns and anti-patterns, widely exist in object oriented systems and are recognized as influencing many software quality attributes. Our goal is to identify their impact on system testability and analyse how they can be leveraged to reduce the testing effort while increasing the system reliability and dependability. The proposed research aims at contributing to reduce complexity and increase testing efficiency by using micro architectures. We will base our work on the rich existing tools of micro architectures detection and code reverse-engineering.
Keywords :
program testing; reverse engineering; software architecture; software reliability; code reverse-engineering; microarchitectures; software dependability; software reliability; system testability; system testing; Measurement; Microarchitecture; Software quality; Software reliability; Testing; Testing; antipatterns; design patterns; test case generation; testability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reverse Engineering (WCRE), 2010 17th Working Conference on
Conference_Location :
Beverly, MA
ISSN :
1095-1350
Print_ISBN :
978-1-4244-8911-4
Type :
conf
DOI :
10.1109/WCRE.2010.47
Filename :
5645492
Link To Document :
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