DocumentCode
3235707
Title
Improving System Testability and Testing with Microarchitectures
Author
SabanÉ, Aminata
Author_Institution
Ptidej Lab., Ecole Polytech. de Montreal, Montréal, QC, Canada
fYear
2010
fDate
13-16 Oct. 2010
Firstpage
309
Lastpage
312
Abstract
Testing is essential to ensure software reliability and dependability. however, testing activities are very expensive and complex. Micro architectures, such as design patterns and anti-patterns, widely exist in object oriented systems and are recognized as influencing many software quality attributes. Our goal is to identify their impact on system testability and analyse how they can be leveraged to reduce the testing effort while increasing the system reliability and dependability. The proposed research aims at contributing to reduce complexity and increase testing efficiency by using micro architectures. We will base our work on the rich existing tools of micro architectures detection and code reverse-engineering.
Keywords
program testing; reverse engineering; software architecture; software reliability; code reverse-engineering; microarchitectures; software dependability; software reliability; system testability; system testing; Measurement; Microarchitecture; Software quality; Software reliability; Testing; Testing; antipatterns; design patterns; test case generation; testability;
fLanguage
English
Publisher
ieee
Conference_Titel
Reverse Engineering (WCRE), 2010 17th Working Conference on
Conference_Location
Beverly, MA
ISSN
1095-1350
Print_ISBN
978-1-4244-8911-4
Type
conf
DOI
10.1109/WCRE.2010.47
Filename
5645492
Link To Document