• DocumentCode
    3235707
  • Title

    Improving System Testability and Testing with Microarchitectures

  • Author

    SabanÉ, Aminata

  • Author_Institution
    Ptidej Lab., Ecole Polytech. de Montreal, Montréal, QC, Canada
  • fYear
    2010
  • fDate
    13-16 Oct. 2010
  • Firstpage
    309
  • Lastpage
    312
  • Abstract
    Testing is essential to ensure software reliability and dependability. however, testing activities are very expensive and complex. Micro architectures, such as design patterns and anti-patterns, widely exist in object oriented systems and are recognized as influencing many software quality attributes. Our goal is to identify their impact on system testability and analyse how they can be leveraged to reduce the testing effort while increasing the system reliability and dependability. The proposed research aims at contributing to reduce complexity and increase testing efficiency by using micro architectures. We will base our work on the rich existing tools of micro architectures detection and code reverse-engineering.
  • Keywords
    program testing; reverse engineering; software architecture; software reliability; code reverse-engineering; microarchitectures; software dependability; software reliability; system testability; system testing; Measurement; Microarchitecture; Software quality; Software reliability; Testing; Testing; antipatterns; design patterns; test case generation; testability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reverse Engineering (WCRE), 2010 17th Working Conference on
  • Conference_Location
    Beverly, MA
  • ISSN
    1095-1350
  • Print_ISBN
    978-1-4244-8911-4
  • Type

    conf

  • DOI
    10.1109/WCRE.2010.47
  • Filename
    5645492