Title :
Q-enhanced fold-and-bond MEMS inductors
Author :
Chen, Po-Jui ; Kuo, Wen-Cheng ; Li, Wen ; Yang, Yao-Joe ; Tai, Yu-Chong
Author_Institution :
Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA
Abstract :
This work presents a novel coil fabrication technology to enhance quality factor (Q factor) of microfabricated inductors for implanted medical wireless sensing and data/power transfer applications. Using parylene as a flexible thin-film device substrate, a post-microfabrication substrate folding-and-bonding method is developed to effectively increase the metal thickness of the surface-micromachined inductors, resulting in their lower self-resistance so their higher quality factor. One-fold-and-bond coils are successfully demonstrated as an example to verify the feasibility of the fabrication technology with measurement results in good agreements with device simulation. Depending on target specifications, multiple substrate folding-and-bonding can be extensively implemented to facilitate further improved electrical characteristics of the coils from single fabrication batch. Such Q- enhanced inductors can be broadly utilized with great potentials in flexible integrated wireless devices/systems for intraocular prostheses and other biomedical implants.
Keywords :
Q-factor; inductors; micromachining; micromechanical devices; prosthetics; Q-enhanced MEMS inductors; biomedical implants; coil fabrication technology; data/power transfer; flexible thin-film device substrate; fold-and-bond MEMS inductors; implanted medical wireless sensing; improved electrical characteristics; intraocular prostheses; parylene; quality factor; substrate folding-and-bonding method; surface-micromachining; Biomedical measurements; Coils; Electric variables; Fabrication; Micromechanical devices; Q factor; Substrates; Thin film devices; Thin film inductors; Wireless sensor networks; bonding; flexible; inductor; parylene; quality factor;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
DOI :
10.1109/NEMS.2008.4484461