Title :
Classifying feature description for software defect prediction
Author :
Zhang, Ling-feng ; Shang, Zhao-wei
Author_Institution :
Coll. of Comput. Sci., Chongqing Univ., Chongqing, China
Abstract :
To overcome the limitation of numeric feature description of software modules in Software defect prediction, we propose a novel module description technology, which employs the classifying feature, rather than numerical feature to describe the software module. Firstly, we construct independent classifier on each software metric. Then the classifying results in each feature are used to represent every module. We apply two different feature classifier algorithms (based on mean criterion and minimum error rate criterion, respectively) to obtain the classifying feature description of software modules. By using the proposed description technology, the discrimination of each metric is enlarged distinctly. Also, classifying feature description is simpler compared to numeric description, which would accelerate the speed of prediction model learning and reduce the storage space of massive data sets. Experiment results on four NASA data sets (CM1, KC1, KC2 and PC1) demonstrate the effectiveness of classifying feature description, and our algorithms can significantly improve the performance of software defect prediction.
Keywords :
pattern classification; program testing; software maintenance; software metrics; NASA data set; feature description classification; independent classifier construction; minimum error rate criterion; numeric feature description; software defect prediction; software metric; software module description technology; Classification algorithms; Error analysis; Predictive models; Software; Software metrics; Training; Feature classifier description; binary classification; software defect prediction;
Conference_Titel :
Wavelet Analysis and Pattern Recognition (ICWAPR), 2011 International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4577-0283-9
DOI :
10.1109/ICWAPR.2011.6014475