Title :
Taking LXI-based systems to the next level with “A-Class” technology
Author_Institution :
VXI Technology, Inc., USA
Abstract :
In the three years since the introduction of the LXI specification, test system designers have quickly embraced the technology and have rapidly integrated the platform into new and existing system designs. Instrument manufacturers are motivated to satisfy the initial demand for LXI-based products as quickly as possible. The result has been an influx of instruments that meet the minimum Class C requirements for LXI certification, with few being certified as fully Class A. This paper steps beyond the minimum capabilities of LXI and details the benefits that applications have leveraged using Class A technology to increase the power of functional test and data acquisition systems.
Keywords :
computerised instrumentation; data acquisition; local area networks; Class A technology; LXI based systems; LXI certification; data acquisition systems; functional test; Backplanes; Certification; Clocks; Costs; Delay; Ethernet networks; Instruments; Manufacturing; Synchronization; System testing;
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2008.4662658
