• DocumentCode
    3235815
  • Title

    Taking LXI-based systems to the next level with “A-Class” technology

  • Author

    Sarfi, Tom

  • Author_Institution
    VXI Technology, Inc., USA
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    458
  • Lastpage
    462
  • Abstract
    In the three years since the introduction of the LXI specification, test system designers have quickly embraced the technology and have rapidly integrated the platform into new and existing system designs. Instrument manufacturers are motivated to satisfy the initial demand for LXI-based products as quickly as possible. The result has been an influx of instruments that meet the minimum Class C requirements for LXI certification, with few being certified as fully Class A. This paper steps beyond the minimum capabilities of LXI and details the benefits that applications have leveraged using Class A technology to increase the power of functional test and data acquisition systems.
  • Keywords
    computerised instrumentation; data acquisition; local area networks; Class A technology; LXI based systems; LXI certification; data acquisition systems; functional test; Backplanes; Certification; Clocks; Costs; Delay; Ethernet networks; Instruments; Manufacturing; Synchronization; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662658
  • Filename
    4662658