DocumentCode
3235815
Title
Taking LXI-based systems to the next level with “A-Class” technology
Author
Sarfi, Tom
Author_Institution
VXI Technology, Inc., USA
fYear
2008
fDate
8-11 Sept. 2008
Firstpage
458
Lastpage
462
Abstract
In the three years since the introduction of the LXI specification, test system designers have quickly embraced the technology and have rapidly integrated the platform into new and existing system designs. Instrument manufacturers are motivated to satisfy the initial demand for LXI-based products as quickly as possible. The result has been an influx of instruments that meet the minimum Class C requirements for LXI certification, with few being certified as fully Class A. This paper steps beyond the minimum capabilities of LXI and details the benefits that applications have leveraged using Class A technology to increase the power of functional test and data acquisition systems.
Keywords
computerised instrumentation; data acquisition; local area networks; Class A technology; LXI based systems; LXI certification; data acquisition systems; functional test; Backplanes; Certification; Clocks; Costs; Delay; Ethernet networks; Instruments; Manufacturing; Synchronization; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2008 IEEE
Conference_Location
Salt Lake Cirty, UT
ISSN
1088-7725
Print_ISBN
978-1-4244-2225-8
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2008.4662658
Filename
4662658
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