Title :
Study on modern signal process and analysis for radiated EMI noise mechanism diagnosis
Author :
Qiu Xiaohui ; Pin Yun-juan ; Yan, Wei ; Yan Wei ; Luo Yong-chao ; Rong, Rong ; Wen, Feng
Author_Institution :
Sch. of Commun. Eng., Nanjing Univ. of Post & Telecommun., Nanjing, China
Abstract :
Traditional electromagnetic (EM) measurement can´t identify the electromagnetic interference (EMI) noise mechanism. In the paper, a novel method is proposed to analysis the radiated EMI noise sources by modern signal process. Then, the near field wave impedance approach is present to diagnosis the mechanism of radiated EMI noise. The results show that the suggested method is more valid, effective and convenient.
Keywords :
electromagnetic interference; electromagnetic interference; near field wave impedance approach; radiated EMI noise mechanism diagnosis; signal process; Decision support systems; Electromagnetic interference; Signal analysis; Signal processing; Virtual reality; Electromagnetic compatibility; Electromagnetic interference; Fast ICA; Noise mechanism diagnosis; Noise source separation;
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
DOI :
10.1109/ICMMT.2010.5525157
