DocumentCode :
3235931
Title :
RF/microwave switch considerations
Author :
Forcier, Neil
Author_Institution :
Syst. Products Div., Agilent Technol., Inc., Loveland, CO
fYear :
2008
fDate :
8-11 Sept. 2008
Firstpage :
484
Lastpage :
489
Abstract :
To optimize performance and repeatability in a test system, test-system designers must address a multitude of RF/microwave switch challenges that may seem overwhelming. For companies that want to control lead times, costs, and the physical layout of a custom switch solution, these challenges must be overcome. The challenges arise from a group of performance- and repeatability-degrading devices that are situated between the test equipment and the device under test. These devices are the switches, cables, signal conditioners, and the signal path control interface. This paper will assist engineers in minimizing the negative effects of these devices by exploring factors that must be considered when creating a custom RF/microwave switch solution.
Keywords :
automatic testing; microwave switches; RF switch; microwave switch; negative effects; test system design; Cables; Circuit testing; Costs; Instruments; Microwave devices; Radio frequency; Solid state circuits; Switches; System testing; Test equipment; Repeatability; Switch Matrix; electromechanical switch; solid state switch;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
ISSN :
1088-7725
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2008.4662664
Filename :
4662664
Link To Document :
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