Title :
Silicon-on-insulator-with-active-substrate (SOIAS) technology
Author :
Yang, Isabel Y. ; Lochtefeld, Anthony ; Antoniadis, Dimitri A.
Author_Institution :
MIT, Cambridge, MA, USA
fDate :
30 Sep-3 Oct 1996
Abstract :
SOIAS (SOI with Active Substrate) is a novel, SOI-based technology which enables the integration in the third dimension of gates and interconnects by utilizing buried under-layers. The fabrication of SOIAS substrates takes full advantage of the existing technologies of Chemical Mechanical Polishing (CMP) and wafer bonding. The active buried under-layers can be pre-patterned isolated gates or interconnects using high temperature refractory metals such as tungsten, or blanket insulating or semi-insulating films of polysilicon which can be rendered conductive by masking and selective doping. SOIAS substrate preparation and materials characterization are described
Keywords :
CMOS integrated circuits; MOSFET; SIMOX; buried layers; etching; integrated circuit interconnections; integrated circuit technology; polishing; wafer bonding; 3D integration; CMOS; NMOSFET; SIMOX wafer; SOI-with-active-substrate technology; SOIAS substrates; Si-SiO2; blanket insulating films; buried under-layers; chemical mechanical polishing; high temperature refractory metals; interconnects; masking; materials characterization; polysilicon; pre-patterned isolated gates; selective doping; semi-insulating films; wafer bonding; Chemical technology; Conductive films; Fabrication; Insulation; Isolation technology; Optical films; Silicon on insulator technology; Temperature; Tungsten; Wafer bonding;
Conference_Titel :
SOI Conference, 1996. Proceedings., 1996 IEEE International
Conference_Location :
Sanibel Island, FL
Print_ISBN :
0-7803-3315-2
DOI :
10.1109/SOI.1996.552516