Title :
Optimizing test systems for operational test benefits using parallel test capable instruments
Author :
Heide, Carl ; Hoover, Robert
Author_Institution :
Teradyne Inc., North Reading, MA
Abstract :
In the past operational testing has either been too expensive or to complex to offer return on investment sufficient to justify developing a general purpose automatic test system (ATS). A small change in the way one traditionally thinks about tester/TPS development opens the door to increased return on investment in ATS equipment and ATS programs.
Keywords :
automatic test equipment; automatic test equipment; general purpose automatic test system; operational test benefits; parallel test capable instruments; Analog-digital conversion; Automatic testing; Circuit testing; Costs; Electronic equipment testing; Instruments; Investments; Sequential analysis; System testing; Wiring; functional test; multifunction analog; operational test; parallel test; test methods;
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2008.4662668
