DocumentCode :
3236216
Title :
Formal verification using bounded model checking: SAT versus sequential ATPG engines
Author :
Saab, Daniel G. ; Abraham, Jacob A. ; Vedula, Vivekananda M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
fYear :
2003
fDate :
4-8 Jan. 2003
Firstpage :
243
Lastpage :
248
Abstract :
Industry is beginning to use Satisfiability (SAT) solvers extensively for formally verifying the correctness of digital designs. In this paper we compare the performance of SAT solvers with sequential Automatic Test Pattern Generation (ATPG) techniques for property verification. Our experimental results on the ISCAS benchmarks as well as a model of the 8085 microprocessor show that, contrary to popular belief, ATPG techniques perform much better than SAT based verification techniques, especially for large designs.
Keywords :
automatic test pattern generation; circuit CAD; computability; formal verification; integrated circuit design; logic CAD; sequential circuits; 8085 microprocessor model; ISCAS benchmarks; SAT based verification; bounded model checking; formal verification; satisfiability solvers; sequential ATPG engines; sequential automatic test pattern generation; Automatic test pattern generation; Boolean functions; Computer bugs; Data structures; Design engineering; Engines; Formal verification; Jacobian matrices; Logic design; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2003. Proceedings. 16th International Conference on
ISSN :
1063-9667
Print_ISBN :
0-7695-1868-0
Type :
conf
DOI :
10.1109/ICVD.2003.1183144
Filename :
1183144
Link To Document :
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