DocumentCode

3236231

Title

Innovative approach to test dramatically cuts IC design cycles

Author

Yeum, Chester

Author_Institution

Xpress Test Solutions, Inc., USA

fYear

2008

fDate

8-11 Sept. 2008

Firstpage

556

Lastpage

556

Keywords

Integrated circuit testing; Production;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON, 2008 IEEE

Conference_Location

Salt Lake City, UT, USA

ISSN

1088-7725

Print_ISBN

978-1-4244-2225-8

Electronic_ISBN

1088-7725

Type

conf

DOI

10.1109/AUTEST.2008.4662679

Filename

4662679