• DocumentCode
    3236251
  • Title

    Analysis of electromagnetic emissions to determine UUT health

  • Author

    Cicchiani, John A. ; Hartmuller, Tricia L. ; Sell, Chris M. ; Wright, R. Glenn

  • Author_Institution
    GMA Ind. Inc., Annapolis, MD
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    557
  • Lastpage
    561
  • Abstract
    An innovative approach is described for diagnosing faults in printed circuit boards (PCB) and PCB components through the detection, analysis, and localization of electrical field changes that occur within and around the PCB. This method utilizes electromagnetic emissions (EME) originating from the PCB to determine circuit health. EME from rapidly changing voltages and currents within high-speed logic and other circuits have traditionally been seen as a problematic source of interference that must be eliminated to as great an extent as possible. However, changes within these emissions can be a highly significant indicator that a failure has occurred within a PCB component as well as within adjacent circuit card paths of the board itself. Further, the hardware and software requirements needed to capture and analyze these emissions are relatively simple in comparison to todaypsilas highly complex automatic test equipment. This unique approach involves analyzing electromagnetic emission signatures through automated means, and ascribing failures to the circuit board as a whole, as well as to the individual circuit board components.
  • Keywords
    electromagnetic interference; fault diagnosis; printed circuit testing; PCB components; UUT health; adjacent circuit card paths; complex automatic test equipment; electromagnetic emission signatures; electromagnetic emissions; fault diagnosis; hardware aan-oftware requirements; printed circuit boards; unit under test; Automatic test equipment; Circuit faults; Electrical fault detection; Electromagnetic analysis; Failure analysis; Hardware; Interference elimination; Logic circuits; Printed circuits; Voltage; ADR; EME; automatic defect recognition; electromagnetic emissions; fault detection; integrated circuits; printed circuit boards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662680
  • Filename
    4662680