• DocumentCode
    3236326
  • Title

    A modified EMI noise source impedance modeling by employing two resistances calibration and Levenberg-Marquardt´s method

  • Author

    Yan Wei ; Yan, Wei ; Lu Xiao-quan ; Dong Ying-hua ; Wen, Feng

  • Author_Institution
    Sch. of Electr. & Autom. Eng., Nanjing Normal Univ., Nanjing, China
  • fYear
    2010
  • fDate
    8-11 May 2010
  • Firstpage
    2021
  • Lastpage
    2024
  • Abstract
    In order to design a effective EMI filter, noise source impedance (complex impedance) is very crucial, but actually, the result is low accuracy and no phase by employing traditional approaches. In the paper, a modified EMI noise source impedance modeling is proposed to investigate the characterization of EMI source impedance. The test shows that suggested method is more accurate and effective. Moreover, both amplitude and phase can be obtained.
  • Keywords
    electric impedance; electromagnetic interference; filters; EMI filter; EMI noise source impedance modeling; Levenberg-Marquardt method; resistance calibration; Calibration; Decision support systems; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Filters; Impedance; Phase noise; Testing; Zirconium; Electromagnetic compatibility; Electromagnetic interference; Levenberg-Marquardt´s method; Noise source impedance modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-5705-2
  • Type

    conf

  • DOI
    10.1109/ICMMT.2010.5525177
  • Filename
    5525177