• DocumentCode
    3236364
  • Title

    Improve design efficiency and test capabilities with HIL Simulation

  • Author

    Washington, Chris ; Delgado, Santiago

  • Author_Institution
    Software Product Marketing, Nat. Instrum., Austin, TX
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    593
  • Lastpage
    594
  • Abstract
    Customer expectations and governmental requirements have changed the way engineers develop products. From automobiles and airplanes to industrial equipment and national defense systems, designers are adding intelligence to their products in the form of electronic controllers. A direct result of this evolution of product design; the testing complexity for these products is growing at an exponential rate. To address this challenge, many engineers have turned to a technique called hardware-in-the-loop (HIL) Simulation. HIL simulation is a test technique that allows the engineer to begin testing their electronic controller earlier in the development process and with greater flexibility compared to physical testing alone. While not a replacement for physical testing; in many situations, such as the testing of a flight control system, HIL simulation is the only viable option for development testing due to the potential consequences that may result from a failed test. In this paper, we will show how HIL simulation is being used today and discuss a general architecture for building a HIL simulator. We will also comment on many considerations that should be taken when specifying a HIL simulator.
  • Keywords
    CAD; automatic testing; digital simulation; product design; HIL simulation; customer expectation; design efficiency; electronic controllers; governmental requirements; hardware-in-the-loop simulation; industrial equipment; national defense systems; product design; test capabilities; Airplanes; Automobiles; Automotive engineering; Defense industry; Electrical equipment industry; Electronic equipment testing; Electronics industry; Industrial control; Intelligent vehicles; System testing; hardware in the loop; hil; simulation; validation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662686
  • Filename
    4662686