DocumentCode
3236364
Title
Improve design efficiency and test capabilities with HIL Simulation
Author
Washington, Chris ; Delgado, Santiago
Author_Institution
Software Product Marketing, Nat. Instrum., Austin, TX
fYear
2008
fDate
8-11 Sept. 2008
Firstpage
593
Lastpage
594
Abstract
Customer expectations and governmental requirements have changed the way engineers develop products. From automobiles and airplanes to industrial equipment and national defense systems, designers are adding intelligence to their products in the form of electronic controllers. A direct result of this evolution of product design; the testing complexity for these products is growing at an exponential rate. To address this challenge, many engineers have turned to a technique called hardware-in-the-loop (HIL) Simulation. HIL simulation is a test technique that allows the engineer to begin testing their electronic controller earlier in the development process and with greater flexibility compared to physical testing alone. While not a replacement for physical testing; in many situations, such as the testing of a flight control system, HIL simulation is the only viable option for development testing due to the potential consequences that may result from a failed test. In this paper, we will show how HIL simulation is being used today and discuss a general architecture for building a HIL simulator. We will also comment on many considerations that should be taken when specifying a HIL simulator.
Keywords
CAD; automatic testing; digital simulation; product design; HIL simulation; customer expectation; design efficiency; electronic controllers; governmental requirements; hardware-in-the-loop simulation; industrial equipment; national defense systems; product design; test capabilities; Airplanes; Automobiles; Automotive engineering; Defense industry; Electrical equipment industry; Electronic equipment testing; Electronics industry; Industrial control; Intelligent vehicles; System testing; hardware in the loop; hil; simulation; validation;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2008 IEEE
Conference_Location
Salt Lake Cirty, UT
ISSN
1088-7725
Print_ISBN
978-1-4244-2225-8
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2008.4662686
Filename
4662686
Link To Document