• DocumentCode
    3236376
  • Title

    Protocol Aware ATE with FPGA-based hardware

  • Author

    Aggarwal, Vineet

  • Author_Institution
    Nat. Instrum., Austin, TX
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    595
  • Lastpage
    597
  • Abstract
    In his paper last year, Andrew Evans of Broadcom Corporation outlined the exciting concept of Protocol Aware ATE, and even made the plea for ATE vendors to ldquomake a broad paradigm shift in ATE architecture that will enable true system level testing as part of the production test flow and methodology.rdquo [1] This concept of system level testing requires intelligent test equipment to have integrated communication protocols for better simulation and emulation of the native environment around the device-under-test (DUT). Field programmable gate array (FPGA) technology is the answer to achieving this level of hardware customization, but presents many challenges with regard to FPGA implementation, custom hardware integration and software programming interfaces. This paper will discuss the will discuss the topic of protocol aware testing and how to achieve aspects of it with COTS FPGA hardware. It will explore important hardware architectures that are well suited for this concept which include FPGA-based boards with a standard PC interfaces, as well as the increasing need for higher level design tools. Protocol aware ATE is an important step to increase the intelligence of the next generation test system, resulting in increased productivity through hardware abstraction at the protocol level.
  • Keywords
    automatic test equipment; field programmable gate arrays; protocols; COTS; FPGA based hardware; PC interfaces; automatic test equipment; hardware abstraction; protocol aware testing; Circuit testing; Field programmable gate arrays; Hardware; Integrated circuit technology; Logic testing; Programmable logic arrays; Programmable logic devices; Protocols; System testing; Test equipment; ATE; COTS; FPGA; Protocol-Aware;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662687
  • Filename
    4662687