DocumentCode

323648

Title

Semiconductor Testing using Pulsed Power Techniques

Author

Dunlop, A.W. ; Golland, A.

Author_Institution

Mitel Semiconductor UK Ltd.

fYear

1998

fDate

1-2 Apr 1998

fLanguage

English

Publisher

iet

Conference_Titel

Pulsed Power '98 (Digest No. 1998/258 and 1998/441), IEE Symposium on

Conference_Location

IET

Type

conf

Filename

674783