• DocumentCode
    3236631
  • Title

    Immediate neighbor difference IDDQ test (INDIT) for outlier identification

  • Author

    Sabade, Sagar S. ; Walker, D.M.H.

  • Author_Institution
    Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
  • fYear
    2003
  • fDate
    4-8 Jan. 2003
  • Firstpage
    361
  • Lastpage
    366
  • Abstract
    Increasing magnitude and variation in leakage current make it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer have similar fault free properties. By obtaining differences in IDDQ values it is possible to discriminate faulty dice. In this paper we describe a methodology in which comparison of IDDQ of a die with that of its neighboring dice on the wafer is evaluated for screening faulty chips at the wafer level. The analysis based on the SEMATECH test data is presented.
  • Keywords
    CMOS integrated circuits; automatic testing; fault diagnosis; integrated circuit testing; leakage currents; INDIT; SEMATECH test data; fault-free chips; faulty chips; faulty dice; immediate neighbor difference IDDQ test; leakage current; outlier identification; screening; single threshold method; Computer science; Data analysis; Fault detection; Geometry; Leakage current; Testing; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2003. Proceedings. 16th International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-1868-0
  • Type

    conf

  • DOI
    10.1109/ICVD.2003.1183163
  • Filename
    1183163
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3236631