Title :
Immediate neighbor difference IDDQ test (INDIT) for outlier identification
Author :
Sabade, Sagar S. ; Walker, D.M.H.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
Increasing magnitude and variation in leakage current make it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer have similar fault free properties. By obtaining differences in IDDQ values it is possible to discriminate faulty dice. In this paper we describe a methodology in which comparison of IDDQ of a die with that of its neighboring dice on the wafer is evaluated for screening faulty chips at the wafer level. The analysis based on the SEMATECH test data is presented.
Keywords :
CMOS integrated circuits; automatic testing; fault diagnosis; integrated circuit testing; leakage currents; INDIT; SEMATECH test data; fault-free chips; faulty chips; faulty dice; immediate neighbor difference IDDQ test; leakage current; outlier identification; screening; single threshold method; Computer science; Data analysis; Fault detection; Geometry; Leakage current; Testing; Threshold voltage; Very large scale integration;
Conference_Titel :
VLSI Design, 2003. Proceedings. 16th International Conference on
Print_ISBN :
0-7695-1868-0
DOI :
10.1109/ICVD.2003.1183163
