DocumentCode :
3236776
Title :
Analysis of fundamental resolution limit of ionospheric tomography
Author :
Na, Helen ; Lee, Hua
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume :
3
fYear :
1992
fDate :
23-26 Mar 1992
Firstpage :
97
Abstract :
Tomographic reconstruction of ionospheric distributions, such as electron densities, has generated considerable interest due to the possibility of reconstructing two-dimensional images from existing data. Previous remote sensing methods such as ionosonde, differential Doppler, and Faraday rotation have been capable only of one-dimensional reconstructions. An algorithm based upon the filtered backprojection algorithm of X-ray tomography has been developed that provides such two-dimensional images; however, the nature of the ionospheric system limits its resolving capability. The ionospheric tomography imaging system is compared to the traditional X-ray tomography system to determine its fundamental resolution degradation parameters. These parameters are then isolated in order to examine their individual effects on the reconstructed images
Keywords :
computerised tomography; geophysics computing; image processing; ionospheric techniques; electron densities; filtered backprojection algorithm; imaging system; ionospheric distributions; ionospheric system; ionospheric tomography; measurement; radiowave method; reconstructed images; remote sensing methods; resolution degradation parameters; resolution limit; technique; tomographic reconstruction; two-dimensional images; Data acquisition; Degradation; Electrons; Image reconstruction; Image resolution; Interference; Ionosphere; Optical imaging; Satellite broadcasting; X-ray tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech, and Signal Processing, 1992. ICASSP-92., 1992 IEEE International Conference on
Conference_Location :
San Francisco, CA
ISSN :
1520-6149
Print_ISBN :
0-7803-0532-9
Type :
conf
DOI :
10.1109/ICASSP.1992.226267
Filename :
226267
Link To Document :
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