DocumentCode :
3236860
Title :
Scaling analysis of a universal electrode for molecular biosensors
Author :
Sin, Mandy L Y ; Constantino, Victor U. ; Gau, Vincent ; Haake, David A. ; Wong, Pak Kin
Author_Institution :
Dept. of Aerosp. & Mech. Eng., Univ. of Arizona, Tempe, AZ
fYear :
2008
fDate :
6-9 Jan. 2008
Firstpage :
1151
Lastpage :
1155
Abstract :
Nanoscale and molecular manipulation techniques, such as concentration, are crucial for the success of an automated point-of-care diagnostic system. Here, we report the development of an electrokinetic concentrator for integrated bioanalytical systems. By combining different electrokinetic forces, the concentrator is capable of concentrating nanoscale particles in less than 1 min and increasing the concentration by 2 orders of magnitude. The concentrator used a universal electrode design developed for a versatile electrochemical sensor platform. We performed a scaling analysis to generalize and optimize the design of the universal electrode. The data collapse analysis showed that the concentration process follows a universal kinetics, and the time scaling factor (T) scales with the effective electric field (E) as T ~ E0.48plusmn0.15 while the intensity scaling factor (T) increases with the effective electric field (E) as I ~ E0.93plusmn0.12.
Keywords :
biomolecular electronics; biosensors; electrochemical sensors; electrodes; electrokinetic effects; nanoparticles; concentration process; data collapse analysis; electrochemical sensor platform; electrokinetic concentrator; electrokinetic forces; integrated bioanalytical systems; molecular biosensors; nanoscale particles; scaling analysis; universal electrode; AC generators; Aerospace engineering; Biomedical electrodes; Biosensors; Diseases; Electrokinetics; Low voltage; Mechanical engineering; Medical services; Systems engineering and theory; biosensor; electrokinetic concentrator; lab-on-a-chip; molecular manipulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
Type :
conf
DOI :
10.1109/NEMS.2008.4484521
Filename :
4484521
Link To Document :
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