DocumentCode :
3236872
Title :
Efficient RTL power estimation for large designs
Author :
Ravi, Srivaths ; Raghunathan, Anand ; Chakradhar, Srimat
Author_Institution :
C&C Res. Labs., NEC, Princeton, NJ, USA
fYear :
2003
fDate :
4-8 Jan. 2003
Firstpage :
431
Lastpage :
439
Abstract :
The adoption of register-transfer level (RTL) sign-off in ASIC design methodologies, and the increasing scale of system-on-chip integration, are leading to unprecedented accuracy and efficiency demands on RT level estimation tools. In this work, we focus on the deployment of a simulation-based RTL power estimation tool in a commercial design flow, and describe several enhancements that improve its efficiency and scalability for large, industrial designs. We profile the computational effort involved in RTL power estimation, and propose a suite of acceleration techniques, including (i) transformation of the enhanced RTL description (functional model with annotations for power estimation) to be more simulator-friendly, (ii) computation vs. storage tradeoffs, and (iii) a novel variation of statistical sampling, called partitioned sampling. Our techniques result in an optimized allocation of the overall computational effort for power estimation and minimize the computational effort involved in the evaluation of power models. Extensive experimental results in the context of a commercial design flow have yielded promising results (e.g., up to 31× reduction in power estimation time with negligible loss of accuracy) on industrial designs of up to 1.25 million transistors. In addition to accurate power estimation for an entire circuit, these acceleration techniques result in superior accuracy of local power estimates for individual components or small sub-circuits, compared to conventional sampling or test-bench compaction techniques.
Keywords :
application specific integrated circuits; circuit CAD; circuit simulation; integrated circuit design; logic CAD; logic simulation; sampling methods; RTL power estimation tool; acceleration techniques; computation/storage tradeoffs; enhanced RTL description transformation; estimation efficiency; estimation scalability; large ASIC design; optimized computational effort allocation; partitioned sampling; power estimation time reduction; register-transfer level sign-off; statistical sampling; Acceleration; Application specific integrated circuits; Circuit testing; Computational modeling; Design methodology; Life estimation; Sampling methods; Scalability; System-on-a-chip; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2003. Proceedings. 16th International Conference on
ISSN :
1063-9667
Print_ISBN :
0-7695-1868-0
Type :
conf
DOI :
10.1109/ICVD.2003.1183173
Filename :
1183173
Link To Document :
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