Title :
Novel burst error correcting algorithms for Reed-Solomon codes
Author_Institution :
Link-A-Media Devices Corp., Santa Clara, CA, USA
fDate :
Sept. 30 2009-Oct. 2 2009
Abstract :
In this paper, we present three novel burst error correcting algorithms for an (n,k,r = n - k) Reed-Solomon code. The algorithmic complexities are of the same order for erasure-and-error decoding, O(rn), moreover, their hardware implementation shares the elements of the Blahut erasure-and-error decoding. In contrast, all existing single-burst error correcting algorithms, which are equivalent to the proposed first algorithm, have cubic complexity, O(r2n). The first algorithm corrects the shortest single-burst with length f <r. The algorithm follows the key characterization that the starting locations of all candidate bursts can be purely determined by the roots of a polynomial which is a linear function of syndromes, and moreover, the shortest burst is associated with the longest sequence of consecutive roots. The algorithmic miscorrection rate is bounded by nqf-r, where q denotes the field size. The second algorithm extends the first one to correct the shortest burst with length f < r-2 with up to a random error. The algorithmic miscorrection rate is bounded by n2qf+1-r. The third algorithm aims to correct the shortest burst with length f < r -2¿ with up to ¿ random errors, where ¿ is a given small number. The algorithmic miscorrection rate is bounded by n¿+1q-(r-f-¿) while its defect rate is bounded by nq-(r-2¿-f)¿ (whereas no defect occurs to the proposed first and second algorithms).
Keywords :
Reed-Solomon codes; error correction codes; Reed-Solomon codes; algorithmic miscorrection rate; burst error correcting algorithms; erasure-and-error decoding; polynomial; Computational complexity; Decoding; Equations; Error correction; Error correction codes; Hardware; Polynomials; Redundancy; Reed-Solomon codes; Shift registers;
Conference_Titel :
Communication, Control, and Computing, 2009. Allerton 2009. 47th Annual Allerton Conference on
Conference_Location :
Monticello, IL
Print_ISBN :
978-1-4244-5870-7
DOI :
10.1109/ALLERTON.2009.5394877