Title :
A Virtual Instrument for Non-invasive Intracranial Pressure Detection
Author :
Shuren, Qin ; Zhong, Ji
Author_Institution :
Coll. of Mech. Eng., Chongqing Univ., Chongqing
Abstract :
It is an important precondition for the diagnosis of craniocerebral injury that intracranial pressure (ICP) can be detected effectively. However, currently the detection methods for ICP usually used in clinical are invasive detection methods, which have many limitations in use. On the base of comparing current several non-invasive ICP detection technologies, the linear relation between flash visual evoked potential (FVEP) and intracranial pressure is employed to develop a virtual instrument system for non-invasive intracranial pressure detection and analysis. In this instrument system, an improved independent component analysis (ICA) is applied to detect FVEP waveform with single-trial. Then based on the linear relation between the potential latency of N2 wave in FVEP waveform and intracranial pressure, the non-invasive ICP detection can be performed. Compared with the results of invasive detection methods of ICP, the values of intracranial pressure and the variation trend of ICP can be well indicated by the instrument.
Keywords :
biological techniques; independent component analysis; virtual instrumentation; visual evoked potentials; craniocerebral injury diagnosis; flash visual evoked potential waveform; independent component analysis; noninvasive intracranial pressure detection; virtual instrument system; Bioelectric phenomena; Conferences; Cranial pressure; Data acquisition; Delay; Independent component analysis; Instruments; Iterative closest point algorithm; Noise reduction; Signal to noise ratio; Detection with single-trial; Flash visual evoked potential(FVEP); Independent component analysis(ICA); Intracranial pressure(ICP); virtual instrument(VI);
Conference_Titel :
Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2005. IDAACS 2005. IEEE
Conference_Location :
Sofia
Print_ISBN :
0-7803-9445-3
Electronic_ISBN :
0-7803-9446-1
DOI :
10.1109/IDAACS.2005.282987