Title :
The electrical breakdown properties of low density polyethylene film due to morphological change
Author :
Hong, Nung-Pyo ; Pil-Gyu Im ; Kim, Deok-Jung ; Cho, Kyung-Soon ; Cho, Don-Chan ; Lee, Yong-Woo ; Hong, Jin-woong
Author_Institution :
Power Electron. Team, Samsung Semicond., Bochun, South Korea
Abstract :
In order to investigate the effects of morphological changes on electrical breakdown, we studied direct current and impulse breakdown phenomena of low density polyethylene films annealed at 100°C for 60 minutes in silicone oil and subsequently cooled in various ways. The degree of crystallinity was estimated by infrared absorption and X-ray diffraction measurements for specimens slowly cooled in air, cooled in water, and cooled in liquid nitrogen (LN2). The crystalline size and distribution of the specimen were measured by differential scanning calorimetry methods. The impulse breakdown strength at 30 and 50°C increased with decreasing crystallinity, suggesting a thermal electronic breakdown process. The impulse breakdown strength decreased with increasing temperature in line with Frohlich-type breakdown theory. The DC breakdown strength was only dependent on crystallinity in the high temperature region
Keywords :
X-ray diffraction; annealing; electric breakdown; impulse testing; infrared spectra; polyethylene insulation; polymer films; polymer structure; thermal analysis; 100 C; 30 C; 50 C; 60 min; DC breakdown strength; Frohlich-type breakdown theory; X-ray diffraction; annealing; breakdown strength; cooling methods; degree of crystallinity; differential scanning calorimetry; direct current breakdown; electrical breakdown properties; impulse breakdown phenomena; infrared absorption; low density polyethylene film; morphological change; silicone oil; thermal electronic breakdown; Annealing; Crystallization; Electric breakdown; Electromagnetic wave absorption; Nitrogen; Petroleum; Plastic films; Polyethylene; Semiconductor films; X-ray diffraction;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location :
Millbrae, CA
Print_ISBN :
0-7803-3580-5
DOI :
10.1109/CEIDP.1996.564566