Parametric investigation and measurement of near end and far end crosstalk in multiconductor microstrip transmission lines

This paper investigates and measures the near end and far end crosstalk in the multiconductor transmission line (MTL) mounted on the PCB by varying the parameters which are associated with physical dimension, characteristic of the substrate and the nature of input signal. With the variation of these factors, the coupling inductance and capacitance vary causing crosstalk. By using the method of moment (MoM), the per unit length parameters are calculated for microstrip lines. Subcircuit model is used to investigate the time domain and frequency domain analysis of near field and far field crosstalk. This parametric investigation is very useful for designing high speed interconnectors on PCB substrates. Some experimental results are presented to validate the analytical findings.