DocumentCode :
3238379
Title :
Impulse electromagnetic interference generator
Author :
Verma, Rishi ; Shyam, A. ; Chaturvedi, S. ; Kumar, R. ; Lathi, D. ; Sarkar, P. ; Chaudhary, V. ; Shukla, Rohit ; Debnath, K. ; Sharma, S. ; Sonara, J. ; Shah, K. ; Adhikary, B. ; Jigna, T. ; Piyush, J.
Author_Institution :
Pulsed Power Group, Inst. for Plasma Res., Gandhinagar, India
fYear :
2004
fDate :
23-26 May 2004
Firstpage :
543
Lastpage :
546
Abstract :
Electromagnetic interference (EMI) related malfunctioning of equipment containing electronic control devices has become a serious problem these days, as it couples to wires and PCB´s in the equipment, reflecting and resonating and then being amplified by an IC finally resulting in malfunction. In order to test and simulate the immunity of electronic circuits to an EMI environment, an electrical fast transient/burst generator has been developed which generates broadband interference spectrum in the range of 20 MHz to 600 MHz. The burst generator is mainly comprised of coaxial cables, pressurized spark gaps, a HV Power Supply, a terminating resistor and a TEM horn which acts as load. For pulse sharpening, switching has been done at two stages. Depending upon the delay time of coaxial line, the width of the square wave pulse has been kept at 50 ns. The total energy of the portable system is 34 Joules, and it weighs less than 50 kg. In the presented paper we describe the system design, results of measurements and areas of further improvements in energy transfer efficiency.
Keywords :
coaxial cables; electromagnetic interference; electronic equipment testing; horn antennas; immunity testing; pulse generators; pulsed power supplies; 20 to 600 MHz; 34 J; EMI; HV power supply; IC; TEM horn; broadband interference spectrum; burst generator; coaxial cables; delay time; electrical fast transient; electronic circuit immunity; electronic control devices; energy transfer efficiency; impulse electromagnetic interference generator; portable system; pressurized spark gap; pulse sharpening; resistor; square wave pulse; Circuit simulation; Circuit testing; Coupling circuits; Electromagnetic coupling; Electromagnetic interference; Electronic circuits; Electronic equipment testing; Immunity testing; Pulsed power supplies; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator Symposium, 2004 and 2004 High-Voltage Workshop. Conference Record of the Twenty-Sixth International
Print_ISBN :
0-7803-8586-1
Type :
conf
DOI :
10.1109/MODSYM.2004.1433634
Filename :
1433634
Link To Document :
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