Optimal High-Resolution Spectral Analyzer

Author

Tchegho, A. ; Mattes, H. ; Sattler, S.

Author_Institution

Inst. of Electron. Design Autom., Tech. Univ. Munchen, Munich

fYear

2008

fDate

10-14 March 2008

Firstpage

62

Lastpage

67

Abstract

This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for the signal analysis is the fast Fourier transform (FFT algorithms). Such complex algorithms are not suitable for BIST (built-in self-test) or BOST (built-off self-test) solutions due to their high demand for resources. In this paper, the Goertzel algorithm will be presented as an alternative to FFT algorithms. A new optimized structure of the Goertzel algorithm and its implementation in an FPGA (field programmable gate array) is presented. A comparison within the scope of the production test of RF transceiver devices shows a considerable reduction of the test time (factor 6) and resources (factor 10) compared to a FFT software solution respectively hardware solution.

Keywords

field programmable gate arrays; logic testing; spectral analysers; FPGA; Field Programmable Gate Array; Goertzel algorithm; RF transceiver production test; high-resolution spectral analyzer; mixed-signal circuit testing; signal generation; Built-in self-test; Circuit testing; Fast Fourier transforms; Field programmable gate arrays; Production; Radio frequency; Signal analysis; Signal generators; Software testing; Spectral analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe, 2008. DATE '08

Conference_Location

Munich

Print_ISBN

978-3-9810801-3-1

Electronic_ISBN

978-3-9810801-4-8

Type

conf

DOI

10.1109/DATE.2008.4484661

Filename

4484661