Title :
Diagnostic Analysis of Static Errors in Multi-Step Analog to Digital Converters
Author :
Zjajo, Amir ; De Gyvez, Jose Pineda
Author_Institution :
NXP Semicond. Res., Eindhoven
Abstract :
A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepest-descent method is proposed. To set initial data, estimate the parameter update and to guide the test, dedicated sensors have been designed. The information obtained through monitoring process variations is re-used and supplement the circuit calibration. The technique also allows the test procedure to test only for the most likely group of faults induced by a manufacturing process. The implemented design-for-test approach permits circuit reconfiguration in such a way that all sub-blocks are tested for their full input range allowing full observability and controllability of the device under test.
Keywords :
analogue-digital conversion; design for testability; fault diagnosis; logic testing; circuit calibration; circuit reconfiguration; controllability; design-for-test approach; device under test; diagnostic analysis; multi-step ADC; multi-step analog to digital converters; observability; static errors; steepest-descent method; Analog-digital conversion; Calibration; Circuit faults; Circuit testing; Design for testability; Error analysis; Manufacturing processes; Monitoring; Observability; Parameter estimation;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
DOI :
10.1109/DATE.2008.4484663
