DocumentCode
3238492
Title
Automatic synthesis of equipment recipes from specified wafer-state transitions
Author
Davis, Joseph C. ; Mozumder, P.K. ; Burch, Richard ; Fernando, Chenjing
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
fYear
1997
fDate
35589
Firstpage
62
Lastpage
65
Abstract
Run-to-run and supervisory control algorithms determine the equipment recipe to produce a desired output wafer state given the Incoming wafer state and the current equipment model. For linear or univariate non-linear equipment models, this problem is trivial. However, when there are multiple responses for the system and the equipment models are nonlinear, the automated synthesis of recipes is complicated by the potential for multiple solutions. We present a framework for performing automated synthesis of recipes that imposes quasi-continuity on the extracted recipes, is scalable to systems of high dimensionality, and performs very quickly. The framework relies on a hierarchical approach that uses pre-determined starting points and local optimisation to determine the best recipe for a given wafer-state transition. A test implementation of this system has shown very good performance
Keywords
electronic engineering computing; integrated circuit manufacture; optimisation; production control; production engineering computing; IC production; automatic synthesis; equipment recipes; hierarchical approach; local optimisation; multiple responses; nonlinear equipment models; recipe synthesis algorithm; run-to-run control algorithms; specified wafer-state transitions; supervisory control algorithms; Ear; Instruments; Performance evaluation; Sampling methods; Semiconductor device modeling; Supervisory control; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Statistical Metrology, 1997 2nd International Workshop on
Conference_Location
Kyoto
Print_ISBN
0-7803-3737-9
Type
conf
DOI
10.1109/IWSTM.1997.629414
Filename
629414
Link To Document