• DocumentCode
    3238583
  • Title

    Parametric Throughput Analysis of Synchronous Data Flow Graphs

  • Author

    Ghamarian, A.H. ; Geilen, M.C.W. ; Basten, T. ; Stuijk, S.

  • Author_Institution
    Electron. Syst. Group, Eindhoven Univ. of Technol., Eindhoven
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    116
  • Lastpage
    121
  • Abstract
    Synchronous data flow graphs (SDFGs) have proved to be a very successful tool for modeling, analysis and synthesis of multimedia applications targeted at both single- and multiprocessor platforms. One of the most prominent performance constraints of concurrent real-time applications is throughput. For given actor execution times, throughput can be verified by analyzing the SDFG models of such applications, for instance using maximum cycle mean analysis or state space analysis. In various contexts, such as design space exploration or run-time reconfiguration, many fast throughput computations are required for varying actor execution times. We present methods to compute throughput of an SDFG where actor execution times can be parameters. The throughput of these graphs is obtained in the form of a function of these parameters. Recalculation of throughput is then merely an evaluation of this function for specific parameter values, which is much faster than the standard throughput analysis. We propose three different algorithms for parametric throughput analysis and evaluate these algorithms experimentally, showing the feasibility of the approach and showing that a divide and conquer algorithm performs best.
  • Keywords
    data flow graphs; divide and conquer methods; SDFG models; actor execution times; divide and conquer algorithm; parametric throughput analysis; synchronous data flow graphs; Algorithm design and analysis; Data analysis; Digital signal processing; Flow graphs; Performance analysis; Runtime; Space exploration; State-space methods; Throughput; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484672
  • Filename
    4484672