• DocumentCode
    3238604
  • Title

    Test procedures for the evaluation of defect tolerance of electrically-stressed polymers

  • Author

    Penuzzottii, F. ; Zaopo, A. ; Mazzanti, G. ; Montanari, G.C.

  • Author_Institution
    Pirelli Cavi S.p.A., Milan, Italy
  • Volume
    1
  • fYear
    1996
  • fDate
    20-23 Oct 1996
  • Firstpage
    48
  • Abstract
    The influence of conductive defects, able to amplify electric field magnitude, on insulation breakdown is investigated in this paper by short-term tests. Appropriate test cells were used, made according to a Rogowski profile, where a set of semiconductive needle-shaped indents starting from the outer surface is realized. Samples of XLPE specimens were tested, differing for the types of additives used as voltage stabilizer and electrical tree retardant. The results of electric strength measurements are dealt with in the paper, with the purpose to show that the proposed test cell provides Weibull-distributed breakdown data, characterized by acceptable confidence intervals and repeatibility. This enables an effective comparison between materials, even in the case that the presence of additives does not change remarkably material performances. Moreover, the multiplicity of indents helps in averaging the considerable influence of the curvature radius of needles, which may play a fundamental role in the usual test cells realized by needle-plane electrode configuration
  • Keywords
    Weibull distribution; XLPE insulation; electric breakdown; electric strength; insulation testing; trees (electrical); Rogowski profile; Weibull-distributed breakdown data; XLPE specimens; conductive defects; confidence intervals; curvature radius; defect tolerance; electric strength measurements; electrical tree retardant; electrically-stressed polymers; insulation breakdown; needle-plane electrode configuration; repeatibility; semiconductive needle-shaped indents; short-term tests; test cells; voltage stabilizer; Additives; Dielectrics and electrical insulation; Electric breakdown; Electric variables measurement; Electrodes; Insulation testing; Needles; Retardants; Semiconductor device testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
  • Conference_Location
    Millbrae, CA
  • Print_ISBN
    0-7803-3580-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.1996.564586
  • Filename
    564586