DocumentCode :
3238604
Title :
Test procedures for the evaluation of defect tolerance of electrically-stressed polymers
Author :
Penuzzottii, F. ; Zaopo, A. ; Mazzanti, G. ; Montanari, G.C.
Author_Institution :
Pirelli Cavi S.p.A., Milan, Italy
Volume :
1
fYear :
1996
fDate :
20-23 Oct 1996
Firstpage :
48
Abstract :
The influence of conductive defects, able to amplify electric field magnitude, on insulation breakdown is investigated in this paper by short-term tests. Appropriate test cells were used, made according to a Rogowski profile, where a set of semiconductive needle-shaped indents starting from the outer surface is realized. Samples of XLPE specimens were tested, differing for the types of additives used as voltage stabilizer and electrical tree retardant. The results of electric strength measurements are dealt with in the paper, with the purpose to show that the proposed test cell provides Weibull-distributed breakdown data, characterized by acceptable confidence intervals and repeatibility. This enables an effective comparison between materials, even in the case that the presence of additives does not change remarkably material performances. Moreover, the multiplicity of indents helps in averaging the considerable influence of the curvature radius of needles, which may play a fundamental role in the usual test cells realized by needle-plane electrode configuration
Keywords :
Weibull distribution; XLPE insulation; electric breakdown; electric strength; insulation testing; trees (electrical); Rogowski profile; Weibull-distributed breakdown data; XLPE specimens; conductive defects; confidence intervals; curvature radius; defect tolerance; electric strength measurements; electrical tree retardant; electrically-stressed polymers; insulation breakdown; needle-plane electrode configuration; repeatibility; semiconductive needle-shaped indents; short-term tests; test cells; voltage stabilizer; Additives; Dielectrics and electrical insulation; Electric breakdown; Electric variables measurement; Electrodes; Insulation testing; Needles; Retardants; Semiconductor device testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location :
Millbrae, CA
Print_ISBN :
0-7803-3580-5
Type :
conf
DOI :
10.1109/CEIDP.1996.564586
Filename :
564586
Link To Document :
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