• DocumentCode
    3239
  • Title

    Two-Axis Force Sensing and Control of a Reorientable Scanning Probe

  • Author

    Jayanth, G.R. ; Chia-Hsiang Menq

  • Author_Institution
    Dept. of Instrum. & Appl. Phys., Indian Inst. of Sci., Bangalore, India
  • Volume
    18
  • Issue
    2
  • fYear
    2013
  • fDate
    Apr-13
  • Firstpage
    687
  • Lastpage
    696
  • Abstract
    This paper presents the design and implementation of a reorientable scanning probe that is capable of two-axis force sensing and control in the 2-D scanning (X-Z) plane. The probe is comprised of three major components, namely a compliant manipulator, laser measurement system, and magnetic actuation system. Control of the position and orientation of the probe tip is realized by means of magnetic actuation combined with a novel structural design. The design of the manipulator´s compliance and that of the optical path of the laser measurement system together enable achieving sensitivity to lateral (X) forces that is nearly identical to that of normal (Z) forces. The achieved sensitivity ratio, of about 0.6, is significantly higher than that of conventional scanning probe systems. The theoretical bases for the structural design and the sensitivity of the two-axis force sensing system are presented. Subsequently, fabrication of the manipulator is described and the result of experimental evaluation of the scanning probe´s features is discussed. The scanning probe is used to access the vertical and re-entrant features on the two sides of a cylindrical micropipette, which are subsequently scanned by regulating the lateral force of tip-sample interaction.
  • Keywords
    force control; force sensors; laboratory techniques; manipulators; measurement systems; optical variables measurement; probes; 2D scanning plane; compliant manipulator; cylindrical micropipette; force control; laser measurement system; lateral force; magnetic actuation system; normal force; probe tip orientation control; probe tip position control; reorientable scanning probe; sensitivity ratio; structural design; tip-sample interaction; two-axis force sensing; Force; Laser beams; Manipulators; Measurement by laser beam; Neck; Probes; Sensitivity; 2.5-D nanometrology and manipulation; Reorientable scanning probe; two-axis force sensitivity;
  • fLanguage
    English
  • Journal_Title
    Mechatronics, IEEE/ASME Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4435
  • Type

    jour

  • DOI
    10.1109/TMECH.2012.2183145
  • Filename
    6142105